In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope

High resolution in situ magneto-optic Kerr effect and scanning tunneling microscopy setup with all optical components in UHV.

A surface magneto-optic Kerr effect (MOKE) setup fully integrated in an ultrahigh vacuum chamber is presented. The system has been designed to combine in situ MOKE and scanning tunneling microscopy. Magnetic fields up to 0.3 T can be applied at any angle in the transverse plane allowing the study of in-plane and out-of-plane magnetization. The setup performance is demonstrated for a continuous ...

Secondary Electron Trajectories in Scanning Tunneling Microscopy

The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology [1]. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface (Figure 1). The system builds a junction acr...

Simulating Scanning Tunneling Microscope

Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope

This work deals with the preparation and characterization of tungsten tips for the use in UHV low-temperature scanning tunneling microscopy and spectroscopy (STM and STS, respectively). These specific environments require in situ facilities for tip conditioning, for further sharpening of the tips, as well as for reliable tip characterization. The implemented conditioning methods include direct ...

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...